Sheng-Nian Luo (SIMES Seminar)

Date(s) - Jan 26 2015
10:00 AM - 11:00 AM

Shasta Room, Bldg. 40, Room 361


Single-shot, multiframe, ultrafast, imaging of bulk materials in real and reciprocal spaces: Techniques and applications

Sheng-Nian Luo

The Peac Institute of Multiscale Sciences, Chengdu, China


One of the grand challenges in materials physics is dynamic responses to impulsive loading, including shock waves, radiation, and pulsed magnetic field, due to their highly transient nature and extremely complex microstructure effects. Dynamic responses, such as plasticity, damage, phase changes, and chemical reactions, are inherently multiscale and heavily dependent on microstructure. Single-shot, multiframe, in-volume, dynamic, measurements at sub-micron and sub-ns scales are particularly challenging. The development of advanced light sources and charged particle sources, offer opportunities for transformative changes in dynamic materials research. Synchrotron X-ray sources and X-ray free electron lasers are complementary in brilliance, coherence, and time structure (pulse width and repetition rate), and thus in spatial and temporal resolutions as well as measurement methodology. In addition, high flux, short pulse, high energy, coherent, electrons also promise ultrafast transmission electron microscopy. In this talk, I will review some recent developments in the field along with my own perspectives, and present our endeavors along this line, including bulk-scale single-shot experiments at the Advanced Photon Source, and application examples of phase changes, plasticity, damage, instabilities, hotspot formation in energetic materials, and microstructure effects.