"Enhanced Electrical Transparency by Ultrathin LaAlO3 Insertion at Oxide Metal/Semiconductor Heterointerfaces"

Takeaki Yajima: Makoto Minohara, Christopher Bell, Hiroshi Kumigashira, Masaharu Oshima, Harold Y. Hwang, and Yasuyuki Hikita; Nano Lett., 02/05/15.

Additional Authors: Makoto Minohara, Christopher Bell, Hiroshi Kumigashira, Masaharu Oshima, Harold Y. Hwang, and Yasuyuki Hikita

Abstract:

Abstract Image

We demonstrate that the electrical conductivity of metal/semiconductor oxide heterojunctions can be increased over 7 orders of magnitude by inserting an ultrathin layer of LaAlO3. This counterintuitive result, that an interfacial barrier can be driven transparent by inserting a wide-gap insulator, arises from the large internal electric field between the two polar LaAlO3 surfaces. This field modifies the effective band offset in the device, highlighting the ability to design the electrostatic boundary conditions with atomic precision.