" Depth resolved domain mapping in tetragonal SrTiO3 by micro-Laue diffraction"

T. A. Merz: H. Noad, R. Xu, H. Inoue, W. Liu, Y. Hikita, A. Vailionis, K. A. Moler and H. Y. Hwang; Applied Physics Letters, 05/02/16.

Additional Authors: H. Noad, R. Xu, H. Inoue, W. Liu, Y. Hikita, A. Vailionis, K. A. Moler and H. Y. Hwang

Abstract:

We present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domainstructure of SrTiO. At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations (– and -axes) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures